Recent #Power Devices news in the semiconductor industry

3 months ago

➀ This resource covers a wide range of simulation cases, including silicon power devices, wide-bandgap devices, BJT devices, CMOS/Logic devices, ESD devices, memory devices, nanoscale devices, two-dimensional materials, thin-film transistors, photonic devices, and more.

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Power DevicesSimulation
10 months ago
➀ High Temperature Reverse Bias (HTRB) testing evaluates the long-term stability of semiconductor devices like IGBTs under high temperature and reverse bias conditions. ➁ The test monitors leakage current to identify potential weaknesses in edge structures and passivation layers. ➂ HTRB testing follows the IEC 60747-9 standard, ensuring reliability and comparability of test results. ➃ The test conditions include a duration of 1000 hours, voltage at 95% of the maximum rated voltage, and temperature between 125°C and 145°C. ➄ Continuous monitoring of leakage current during the test helps assess device health and detect any degradation.
HTRBPower DevicesReliability Testing